6. Testing items and eligibility criteria for LTE-M1 terminal equipm
6.1 Tests of this section are applicable to LTE-M1 terminal equipment.
6.2 Power limits:
6.2.1 Emission power limit:
6.2.1.1 Effective radiated power (ERP)
1 W for portable terminal equipment.
2 W for mobile terminal equipment.
6.2.1.2 Conducted output power limit:
Class 3: 23 dBm +2.7/-3.2 dB.
Class 5: 20 dBm +2.7/-3.2 dB.
6.2.2 Testing methods:
6.2.2.1 When measuring the emission power, devices must be used with RMS (root mean square) equivalent voltage to measure any continuous transmission time. The measurement results shall be used to adjust the emission power based on the responding time, resolution bandwidth capability and sensitivity of the device.
6.2.2.2 Testing shall be conducted on three channels: low, medium, and high. Tests shall be undertaken on the highest level of bandwidth on each channel and shall comply with the provisions of Table 1.
6.3 Spectrum emission mask:
6.3.1 Limits of the spectrum emission mask: Shall comply with the spectrum emission mask values prescribed in Table 2.
6.3.2 Testing methods:
6.2.2.1 The spectrum emission mask limit values vary according to the bandwidth and f_00B. The resolution bandwidth (RBW) during the measurement shall not be smaller than the set values prescribed in Table 2.
6.3.2.2 Testing shall be conducted on three channels: low, medium, and high. Tests shall be undertaken on the lowest level of bandwidth, 5MHz, 10 MHz, and the highest level of bandwidth on each channel and shall comply with the provisions of Table 3.
6.4 Radiation emission limit outside the conduction band:
6.4.1 Shall comply with specification values of the out-of-band radiation with the provisions of Table 4.
6.4.2 Testing methods:
6.4.2.1 Frequency range of the out-of-band radiation measurement does not include Δf_OOB stated in 6.3.1. During the measurement, the resolution bandwidth shall not smaller than the set value with the provisions of Table 4.
6.4.2.2 Testing shall be conducted on three channels: low, medium, and high. Tests shall be undertaken on the lowest level of bandwidth on each channel and shall comply with the provisions of Table 5.
6.5 Adjacent channel leakage ratio (ACLR):
6.5.1 Shall comply with the ACLR specification values prescribed in Table 6.
6.5.2 Testing Methods:
6.5.2.1 Measure the averaged power of the testing and adjacent channels to calculate the ACLR. During the measurement, the measurement bandwidth of the channels shall adhere to specification values of Table 6.
6.5.2.2 Testing shall be conducted on three channels: low, medium, and high. Tests shall be undertaken on the lowest level of bandwidth, 5MHz, 10 MHz, and the highest level of bandwidth on each channel and shall comply with the provisions of Table 7.
6.6 Emission within non-resource blocks:
6.6.1 Shall comply with specification values of non-resource blocks as prescribed in Table 8.
6.6.2 Testing methods: Tests for the 5 MHz bandwidth shall be conducted according to Table 9.